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Interpretability of Low-Dose HRTEM Images of Supported Metal Nanoparticles

Published online by Cambridge University Press:  22 July 2022

William Bang Lomholdt ,
Matthew Helmi Leth Larsen ,
Cuauhtémoc Núñez Valencia ,
Pei Liu ,
Daniel Kelly ,
Jakob Schiøtz  and
Thomas Willum Hansen
William Bang Lomholdt*
Affiliation:
DTU Nanolab, Technical University of Denmark, Kongens Lyngby, Denmark
Matthew Helmi Leth Larsen
Affiliation:
DTU Physics, Technical University of Denmark, Kongens Lyngby, Denmark
Cuauhtémoc Núñez Valencia
Affiliation:
DTU Physics, Technical University of Denmark, Kongens Lyngby, Denmark
Pei Liu
Affiliation:
DTU Nanolab, Technical University of Denmark, Kongens Lyngby, Denmark
Daniel Kelly
Affiliation:
DTU Nanolab, Technical University of Denmark, Kongens Lyngby, Denmark
Jakob Schiøtz
Affiliation:
DTU Physics, Technical University of Denmark, Kongens Lyngby, Denmark
Thomas Willum Hansen
Affiliation:
DTU Nanolab, Technical University of Denmark, Kongens Lyngby, Denmark
*
*Corresponding author: [email protected]

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2152 - 2154
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Copyright
Copyright © Microscopy Society of America 2022

References

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Liu, P. et al. , Nanoscale 11 (2019), p. 11885, doi: 10.1039/c9nr02731aGoogle Scholar
Liu, P. et al. , J. Phys. Mater. 3 (2020), p. 024009Google Scholar