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STEM-EELS Exploration of Beam-Sensitive Perovskite Nanocrystals

Published online by Cambridge University Press:  22 July 2022

Brittany Ford ,
David W. McComb ,
Michael Brennan  and
Tod Grusenmeyer
Brittany Ford*
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, OH, United States
David W. McComb
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, OH, United States Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, United States
Michael Brennan
Affiliation:
Air Force Research Laboratory, WPAFB, OH, United States
Tod Grusenmeyer
Affiliation:
Air Force Research Laboratory, WPAFB, OH, United States
*
*Corresponding author: [email protected]

Abstract

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Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2160 - 2161
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Copyright
Copyright © Microscopy Society of America 2022

References

Brennan, M. C., et al. , ACS Energy Lett. 5, no. 5 (2020), p. 1465–1473. doi: 10.1021/acsenergylett.0c00630CrossRefGoogle Scholar
Kovalenko, M. V. and Bodnarchuk, M. I., Chimia (Aarau) 71, no. 7–8 (2017), p. 461–470. doi: 10.2533/chimia.2017.461CrossRefGoogle Scholar
Brennan, M. C., et al. , J. Am. Chem. Soc. 139, no. 35 (2017), p. 12201–12208. doi: 10.1021/jacs.7b05683CrossRefGoogle Scholar
Alexander, J. A., et al. , J. Mater. Chem. A. 4, no. 35 (2016) p. 13636–13645. doi: 10.1039/c6ta06201fCrossRefGoogle Scholar