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Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions
Masuda, H. and Fukuda, K., Science268 (1995), p. 1466–1468. DOI: 10.1126/science.268.5216.1466CrossRefGoogle Scholar
[2]
Tsubota, S., et al. , Prep. Catal. VI 91 (1995), p. 227–235. DOI: 10.1016/s0167-2991(06)81759-3Google Scholar
[3]
Kavan, L., et al. , J. Am. Chem. Soc. 118 (1996), p. 6716–6723. DOI: 10.1021/ja954172lCrossRefGoogle Scholar
[4]
The authors acknowledge funding from the CONACYT and IPN (COFAA-SIP). Thanks for the technical support of the Instituto Mexicano del Petróleo and Micra Nanotecnologia S.A. de C.V.Google Scholar