We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.
Department of Materials Science & Engineering, The Ohio State University, Columbus, OH, United States
David W. McComb
Affiliation:
Department of Materials Science & Engineering, The Ohio State University, Columbus, OH, United StatesCenter for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, United States
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Type
Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-beam Sample Interactions