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Sub-Ångström-resolution MicroED Using a Direct Detection Camera

Published online by Cambridge University Press:  30 July 2020

Benjamin Bammes ,
Weijiang Zhou  and
Wah Chiu
Benjamin Bammes
Affiliation:
Direct Electron, LP, San Diego, California, United States
Weijiang Zhou
Affiliation:
Stanford University, Menlo Park, California, United States
Wah Chiu
Affiliation:
Stanford University, Menlo Park, California, United States

Abstract

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Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1524 - 1526
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Copyright
Copyright © Microscopy Society of America 2020

References

Shi, D., Nannenga, B.L., Iadanza, M.G., Gonen, T. (2013). Elife, 2: e01345.10.7554/eLife.01345CrossRefGoogle Scholar
Jones, C.G., Martynowycz, M.W., Hattne, J., Fulton, T.J., Stoltz, B.M., Rodriguez, J.A., Nelson, H.M., & Gonen, T. (2018). The CryoEM method MicroED as a powerful tool for small molecule structure determination. ACS Central Science, 4: 1587–1592.10.1021/acscentsci.8b00760CrossRefGoogle ScholarPubMed
Henderson, R. (1995). The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules. Quarterly Reviews of Biophysics, 28: 171–193.10.1017/S003358350000305XCrossRefGoogle ScholarPubMed
Rodriguez, J.A., Ivanova, M.I., Sawaya, M.R., Cascio, D., Reyes, F.E., Shi, D., Sangwan, S., Guenther, E.L., Johnson, L. M., Zhang, M., Jiang, L., Arbing, M.A., Nannenga, B. L., Hattne, J., Whitelegge, J., Brewster, A.S., Messerschmidt, M., Boutet, S., Sauter, N.K., Gonen, T., & Eisenberg, D. S. (2015). Nature, 525: 486–490.10.1038/nature15368CrossRefGoogle Scholar
Hattne, J., Martynowycz, M.W., Penczek, P.A., & Gonen, T. (2019). MicroED with the Falcon III direct electron detector. IUCrJ, 6: 921–926.10.1107/S2052252519010583CrossRefGoogle ScholarPubMed
Bammes, B.E., Rochat, R.H., Jakana, J., Chen, D-H., & Chiu, W. (2012). Direct electron detection yields cryo-EM reconstructions at resolutions beyond ¾ Nyquist. Journal of Structural Biology, 177: 589–601.10.1016/j.jsb.2012.01.008CrossRefGoogle ScholarPubMed
Faruqi, A.R. & McMullan, G. (2011). Electronic detectors for electron microscopy. Quarterly Reviews of Biophysics, 44: 357–390.10.1017/S0033583511000035CrossRefGoogle ScholarPubMed
Mastronarde, D.N. (2005). Automated electron microscope tomography using robust prediction of specimen movements. Journal of Structural Biology, 152: 36–51.10.1016/j.jsb.2005.07.007CrossRefGoogle ScholarPubMed
Kabsch, W. (2010). XDS. Acta Crystallographica Section D, 66: 125–132.10.1107/S0907444909047337CrossRefGoogle ScholarPubMed
Sheldrick, G.M. (2008). A short history of SHELX. Acta Crystallographica Section A, 64: 112–122.Google Scholar
This material is based upon work supported by the U.S. Department of Energy, Office of Science, under Award Number DE-SC0020550, and by the U.S. National Institutes of Health, National Institute of General Medical Sciences, under Award Numbers 5P41GM103832 and S10OD021600.Google Scholar