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Structural Characterization of Beam Sensitive Pharmaceutical Compounds Using 3D Electron Diffraction-Micro-ED at Low Dose with Pixelated Detectors

Published online by Cambridge University Press:  30 July 2020

Partha Pratim Das ,
Alejandro Gómez Pérez ,
Athanassios S. Galanis  and
Stavros Nicolopoulos
Partha Pratim Das
Affiliation:
NanoMEGAS SPRL, Brussels, Brussels Hoofdstedelijk Gewest, Belgium
Alejandro Gómez Pérez
Affiliation:
NanoMEGAS SPRL, Brussels, Brabant Wallon, Belgium
Athanassios S. Galanis
Affiliation:
NanoMEGAS SPRL, Brussels, Brussels Hoofdstedelijk Gewest, Belgium
Stavros Nicolopoulos
Affiliation:
NanoMEGAS SPRL, Brussels, Brussels Hoofdstedelijk Gewest, Belgium

Abstract

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Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1522
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Copyright
Copyright © Microscopy Society of America 2020

References

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