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TV-rate Atomic-resolution STEM Imaging

Published online by Cambridge University Press:  30 July 2020

Ryo Ishikawa
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan
Yu Jimbo
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Mitsuhisa Terao
Affiliation:
JEOL, Tokyo, Tokyo, Japan
Masashi Nishikawa
Affiliation:
JEOL, Tokyo, Tokyo, Japan
Yujiro Ueno
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan
Shigeyuki Morishita
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Masaki Mukai
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Naoya Shibata
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan
Yuichi Ikuhara
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan

Abstract

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Type
Approaching Operando Imaging of Functional Materials
Copyright
Copyright © Microscopy Society of America 2020

References

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Ishikawa, R. et al. , Appl. Phys. Lett. 109 163102 (2016).10.1063/1.4965709CrossRefGoogle Scholar
A part of this work was supported by Grant-in-Aid for Specially Promoted Research “Atom-by-atom imaging of ion dynamics in nano-structures for materials innovation” (Grant No. JP17H06094) from JSPS.Google Scholar