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Polarization in Ferroelectric BiFeO3 Imaged in 3D Using Four-dimensional Scanning Transmission Electron Microscopy
Published online by Cambridge University Press: 30 July 2020
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- FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
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- Copyright
- Copyright © Microscopy Society of America 2020
References
Li, L., et al. , Physical Review Letters 120 (2018), 13760210.1103/PhysRevLett.120.137602CrossRefGoogle Scholar
This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430. TEM experiments was conducted using the facilities in the Irvine Materials Research Institute (IMRI) at the University of California-Irvine.Google Scholar
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