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Quantitative Analysis of Correlated Atomic Displacements via Diffuse Electron Scattering

Published online by Cambridge University Press:  30 July 2020

Xi Chen ,
Georgios Varnavides ,
Polina Anikeeva  and
James LeBeau
Xi Chen
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Georgios Varnavides
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
Polina Anikeeva
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States
James LeBeau
Affiliation:
Massachusetts Institute of Technology, Cambridge, Massachusetts, United States

Abstract

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Type
Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 718 - 720
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Copyright
Copyright © Microscopy Society of America 2020

References

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We acknowledge support for this work from the Air Force Office of Scientific Research (FA9550-17-1-0225. This work was performed in part at the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation (award number ECCS-1542015). The AIF is a member of the North Carolina Research Triangle Nanotechnology Network (RTNN), a site in the National Nanotechnology Coordinated Infrastructure (NNCI).Google Scholar