Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

FIB-SEM Tomography and Its Application Towards Understanding Aerosol Optical Properties of Atmospheric Dust Particles

Increasing the Stability and Quality of High-resolution FIB-SEM Tomography

Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectioning Tomography

Characterization of Oxide/Sulfide Molybdenum Hexagonal Rods

Approaching Operando Imaging of Functional Materials

Investigating the Behavior of Cu-based Catalysts During Electrochemical CO2 Reduction with Liquid Cell Electron Microscopy

Fingerprinting the Phases of Thin Film Ge2Sb2Te5 with EELS

Multimodal Analysis of Reaction Pathways of Cathode Materials for Lithium Ion Batteries

Atomic-resolution STEM Analysis of Nanoparticle During Electrocatalytic Reactions

Informing Synthesis Routes with Correlated in Situ Electrothermal Studies in the TEM

Electron Pulses as an Ultrafast Probe for Non-equilibrium Processes

Nanoscale Thermal Transport Across a Semiconductor Heterostructure Interface

Molecular Structural Dynamics Captured with Ultrafast Electron Diffraction

Universality and Breaking of Universality in Photo-induced Non-equilibrium Phase Transitions

Physical Sciences Tutorial: Entrepreneurship in the Microscopy Community

Entrepreneurship in the Microscopy Community

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Filling in the Missing Wedge with Aberration-corrected Electron Tomography

AtomSegNet and TomoFillNet—Two Deep Learning Open-Source Apps for Superresolution Processing of Atomic Resolution Images and Missing-wedge Information Inpainting in Electron Tomograms

Learning Frame Interpolation for Tilt Series Tomography

3D Tomography for Multiple-scattering Samples Using Phase Contrast Electron Microscopy

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures

In Situ 4D-STEM

Imaging Short-range Order and Extracting 3-D Strain Tensor Using Energy-filtered 4D-STEM Techniques

Structural Determination in Metallic Glasses from Correlations in 4D STEM Datasets

Microscopy and Microanalysis

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Volume 26 - December 2020

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

Approaching Operando Imaging of Functional Materials

Electron Pulses as an Ultrafast Probe for Non-equilibrium Processes

Physical Sciences Tutorial: Entrepreneurship in the Microscopy Community

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Four-dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures