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Reasons to Replace a Proportional Counter (PC) in the Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD)

Published online by Cambridge University Press:  30 July 2020

Richard Wuhrer  and
Ken Moran
Richard Wuhrer
Affiliation:
Western Sydney University, Penrith, New South Wales, Australia
Ken Moran
Affiliation:
Moran Scientific Pty Ltd, Bungonia, New South Wales, Australia

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 768 - 771
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Copyright
Copyright © Microscopy Society of America 2020

References

Wuhrer, R. and Moran, K., IOP Conf. Series: Materials Science and Engineering 304 (2017).Google Scholar
Moran, K. and Wuhrer, R., Microsc. Microanal. 22 (Suppl 3), 2016, p92-93.10.1017/S1431927616001318CrossRefGoogle Scholar
Wuhrer, R. and Moran, K., Microsc. Microanal. 23 (Suppl 1), 2017, p1048-1049.10.1017/S1431927617005906CrossRefGoogle Scholar
Moran, K. and Wuhrer, R., Microsc. Microanal. 24 (Suppl 1), 2018, p756-757.10.1017/S1431927618004270CrossRefGoogle Scholar
Moran, K. and Wuhrer, R., Silicon Drift Detector Incorporated into Wavelength Dispersive Spectrometer (SD-WDS) – Allowing Bremsstrahlung Determination by Theoretical Calculation, EMAS 2019, Thondheim Norway.Google Scholar
Moran, K. and Wuhrer, R., Microsc. Microanal. 25 (Suppl 2), 2019, p2316-2317.10.1017/S1431927619012315CrossRefGoogle Scholar
Moran, K. and Wuhrer, R., “New WDS technology, modification of a WDS to a SD-WDS for more reliable results and where to next?”, International Microscopy Congress, Sydney, Australia, IMC 2018.Google Scholar
Authors wish to thank Amptek Inc for the detectors, especially John Pantazis and David Clifford. Authors also wish to thank Western Sydney University Advance Material Characterisation Facility (AMCF) and staff.Google Scholar