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Development of SEM Equipped with Superconductor X-ray Detector Toward Chemical State Nanoimaging for CFRP/adhesive Boundary

Published online by Cambridge University Press:  30 July 2020

Go Fujii ,
Wenqin Peng ,
Masahiro Ukibe ,
Shigetomo Shiki ,
Naoko Yamazaki ,
Koichi Hasegawa ,
Kiyoka Takagi  and
Masataka Ohkubo
Go Fujii
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Wenqin Peng
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Masahiro Ukibe
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Shigetomo Shiki
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan
Naoko Yamazaki
Affiliation:
Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan
Koichi Hasegawa
Affiliation:
Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan
Kiyoka Takagi
Affiliation:
Mitsubishi Heavy Industries, Ltd., Nagoya, Aichi, Japan
Masataka Ohkubo
Affiliation:
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki, Japan

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 764 - 766
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Copyright
Copyright © Microscopy Society of America 2020

References

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