Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

Innovative Grounding Methodology for Epoxy Impregnated Semiconductor Cross Sections for Electron Microscopy Inspection

Observation of Rectifying and Ohmic Grain Boundaries in Polycrystalline BaTiO3 Capacitors with STEM EBIC

Nanoscale Investigation of Layered Oxychloride Intergrowth Photocatalysts for Visible Light Driven Water Splitting

From Photons to Electrons - A Correlative Workflow for Analysis and Preparation of Embedded Samples Using the LaserFIB

Comparison of Cathodoluminescent Emission from Scheelite and Wolframite Structured Electrospun Tungstate Nanofibers

From Magnetite Nanoparticles to Thin Film and Nano-lithographed Arrays

Development of the Fabrication of Graphene Liquid Cells for Transmission Electron Microscopy

Characterization by Scanning Electron Microscopy on Drill Boride and Drilling Performance of Tool Steels

Selective Detection of Secondary Electrons in an SEM using a Multi-Channel Detector

Advanced Characterization of Nuclear Fuels and Materials

Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

Mesoscale Thermal Transport Measurements of Multi-phase and Porous Nuclear Fuels Using a Square-wave Pulse Thermoreflectance Technique

FIB-SEM for Nano-CT of Tritiated LiAlO2 Pellet Nanopores

Advanced Characterization of Phase Stability Under Ion Irradiation of Utrafine-grained and Nanocrystalline SS304L

SEM and EBSD Characterization of Cold-Sprayed Chromium Coatings on Zircaloy-4

AlCoCrFeNi High Entropy Alloys as Possible Nuclear Materials

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering

SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications

Development of the Ruthenium Marking System for Local Defect Observation of Zeolite Membrane

A New Generation Plasma FIB Column with Higher Probe Current and Improved Imaging Resolution

O+ PFIB Milling and Measurement of FIB Damage in Silicon

Operando Investigation of Energy Storage Material by FIB-SEM System

Microscopy and Microanalysis

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Volume 26 - December 2020

Advances in Electron Microscopy to Characterize Materials Embedded in Devices

Advanced Characterization of Nuclear Fuels and Materials

FIB-SEM Technology and Electron Tomography for Materials Science and Engineering