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SIMS Detector on FIB/SEM DualBeam Microscopes for Material Science Applications

Published online by Cambridge University Press:  30 July 2020

Chengge Jiao
Affiliation:
ThermoFisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Xu Xu
Affiliation:
The University of Manchester, Manchester, England, United Kingdom
Timothy Burnett
Affiliation:
The University of Manchester, Manchester, England, United Kingdom
Mikhail Dutka
Affiliation:
ThermoFisher Scientific, Eindhoven, Noord-Brabant, Netherlands
David Wall
Affiliation:
ThermoFisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Brandon van Leer
Affiliation:
ThermoFisher Scientific, Hillsboro, Oregon, United States

Abstract

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Type
FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
Copyright
Copyright © Microscopy Society of America 2020

References

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