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Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study

Published online by Cambridge University Press:  30 July 2020

Joven Lim ,
Eric Prestat ,
Anna Carlsson ,
Graeme Greaves ,
Stephen Donnelly ,
Quentin Ramasse  and
M. Grace Burke
Joven Lim
Affiliation:
UK Atomic Energy Authority, Abingdon, England, United Kingdom
Eric Prestat
Affiliation:
University of Manchester and SuperSTEM Laboratory, Manchester, England, United Kingdom
Anna Carlsson
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Graeme Greaves
Affiliation:
University of Huddersfield, Huddersfield, England, United Kingdom
Stephen Donnelly
Affiliation:
University of Huddersfield, Huddersfield, England, United Kingdom
Quentin Ramasse
Affiliation:
SuperSTEM Laboratory and University of Leeds, Daresbury, England, United Kingdom
M. Grace Burke
Affiliation:
University of Manchester, Manchester, Lancashire, England, United Kingdom

Abstract

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Type
Advanced Characterization of Nuclear Fuels and Materials
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 394 - 395
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Copyright
Copyright © Microscopy Society of America 2020

References

The sample preparation equipment used UKAEA's Materials Research Facility, which has been funded by and is part of the UK's National Nuclear User Facility and Henry Royce Institute for Advanced Materials [Grant No. EP/P021727/1]Google Scholar
This work has been carried out within the framework of the EUROfusion Consortium and has received funding from the Euratom research and training programme 2014–2018 and 2019–2020 under grant agreement No 633053 and from RCUK [grant number EP/T012250/1]. To obtain further information on the data and models underlying this paper please contact [email protected]*. The views and opinions expressed herein do not necessarily reflect those of the European Commission.Google Scholar