Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract

Analysis of Grain Fragmentation in Deformed Materials

Invited Papers

High energy resolution EELS using a monochromized 200 kV TEM: Comparative investigation of titanium oxides

Abstract

EBSD at High Temperatures in Metals and Minerals

Invited Papers

Simulation of Energy-Selected Electron Diffraction Patterns

Abstract

EBSD Pattern Collection and Orientation Mapping at Normal Incidence to the Electron Beam

Preparation of Steels for SEM Backscatter Electron Imaging: Some Observations of Pearlite, Bainite, and Martensite in Plain Carbon Steels

Invited Papers

Effects of Sample Preparation on Cr-Steels: An EFTEM Study

Investigation of Precipitates using an Energy-Filtering Transmission Electron Microscope (EFTEM)

Abstract

Orientation Imaging Microscopy: Sample Preparation for Heavily Drawn Copper wires

Invited Papers

Polarity Determination of Sphalerite-type <110> and <001> Crystal Samples Using Simple Bragg-line Contrast Rules

Abstract

2D Fr-An: A Friendly Interactive Matlab® Based Software for 2D Fractal Analysis of Closed Domain Clusters

Characterization of Porous 95/5 PZT Using Quantitative Image Analysis

Invited Papers

Quantitative EELS of nitrided gate oxides

Strategies for investigating core-shell particles by energy-filtered transmission electron microscopy

Abstract

Automatic Ductile Damage Detection in Microalloyed Fine-Grain Steels

Electron Holography of Naturally Occurring Nanomagnets in Rocks

Invited Papers

Electron energy-loss near-edge structures of silicon carbides

Abstract

Dynamics of Electro-Optically Active Interfaces via Electron Holography and Femto-Second NSOM

Invited Papers

Low Energy Electron Scattering and Electrical Charging in Non-conductive Specimen

Abstract

Off-axis Electron And Light Optical Holograms: How They Process And How They Compare

Microscopy and Microanalysis

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Volume 9 - August 2003

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Invited Papers

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Invited Papers

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Invited Papers

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Invited Papers

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