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EBSD Pattern Collection and Orientation Mapping at Normal Incidence to the Electron Beam

Published online by Cambridge University Press:  28 July 2003

J. K. Farrer ,
M. M. Nowell ,
Damian J. Dingley  and
David J. Dingley
J. K. Farrer
Affiliation:
TSL/EDAX, 392 East 12300 South, Draper, Utah 84020
M. M. Nowell
Affiliation:
TSL/EDAX, 392 East 12300 South, Draper, Utah 84020
Damian J. Dingley
Affiliation:
TSL/EDAX, 392 East 12300 South, Draper, Utah 84020
David J. Dingley
Affiliation:
TSL/EDAX, 392 East 12300 South, Draper, Utah 84020

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 80 - 81
Copyright
Copyright © Microscopy Society of America 2003