Invited Papers
Numerical Nanodiffraction of Amorphous Grain Boundary Films
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- 05 September 2003, pp. 44-45
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Microscopy Society Of America
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- Published online by Cambridge University Press:
- 01 August 2003, pp. 44-52
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Invited Papers
Is there a Stobbs-Factor in Off-axis Electron Holography?
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- 05 September 2003, pp. 46-47
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Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope
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- 05 September 2003, pp. 48-49
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Nanostructured Materials as Studied with the Tomographic Atom Probe (TAP)
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- 06 August 2003, pp. 46-47
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Invited Papers
Enhanced imaging of thin intergranular films in HRTEM using Fourier filtering
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- 05 September 2003, pp. 50-51
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Thermal Stability of Co-Fe and Cu Multilayered Thin Films
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- 06 August 2003, pp. 48-49
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Invited Papers
Quantitative HAADF-STEM image analysis using IMAGE-WARP processing
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- 05 September 2003, pp. 52-53
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Understanding Phase Stability in Multilayers by Atom Probe Analysis
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- 06 August 2003, pp. 50-51
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Microbeam Analysis Society
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- 01 August 2003, pp. 53-57
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Invited Papers
HREM Study of Hexagonal and Rhombohedral Graphites for use as Anodes in Lithium Ion Batteries
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- 05 September 2003, pp. 54-55
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TEM Observations on the Role of Defects in Melting, Migration and Transformation of Pb-rich Precipitates in Al
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- 06 August 2003, pp. 54-55
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Invited Papers
Stability of parameter retrieval using inverse electron scattering
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- 05 September 2003, pp. 56-57
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New Tools for Imaging, Spectroscopy and Diffraction from Nanostructures
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- 05 September 2003, pp. 58-59
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AEM / HRTEM Studies of Interface Diffusion-Controlled Transformations
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- 28 July 2003, pp. 56-57
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Invited Papers
Image analysis and simulation software in transmission electron microscopy
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- 05 September 2003, pp. 60-61
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Tin in Early Chinese Ceramics
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- 06 August 2003, pp. 58-59
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Invited Papers
Quantitative Evaluation of Focal Series in HRTEM
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- 05 September 2003, pp. 62-63
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The InterAmerican Committee of Societies for Electron Microscopy
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- 01 August 2003, pp. 58-59
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Invited Papers
Electron Interference Fringes observed in Fourier Space and its Application
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- 05 September 2003, pp. 64-65
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