Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract

Avoiding the Curtaining Effect: Backside Milling by FIB INLO

Invited Papers

High-Resolution Scanning Electron and Scanning Force Microscopy of the Zeolites EMT, FAU, and the Intergrowth System EMT/FAU

Abstract

FIB Micro-Pillar Sampling Technique For 3D Stem Observation And Its Application

Application of High Energy-resolution Silicon Drift Detectors (SDD) for Quantitative Light Element Analysis

Invited Papers

Analysis of Microstructure and Texture of Thin Films by Coupled Use of EBSD and Other Scanning Techniques

Abstract

Microelectronic Fabrication of Transition Edge Sensors

Invited Papers

Measurement of the Deformation of SPM Tips

Abstract

Improvements to Energy Resolution of an X-ray Energy Dispersive Spectrum by Deconvolution Using the Zero Strobe Peak

Invited Papers

A New Atomic Force Microscope for Biomedical Research as an Add-on to Light Microscopy

AFM of resin embedded, high pressure frozen and freeze-substituted biological material

Abstract

In-situ crystallisation study of phase-change material using transmission electron microscopy

Invited Papers

NaCl crystal in the system (KCl – NaCl – H2O) (AFM data)

Abstract

EFTEM Study of Phase Separations in Borosilicate Glasses Under Electron Beam Irradiation

Invited Papers

SEM, EPMA and TXRF characterization of electrochemically modified electrode surfaces

Abstract

In-situ Magnetodynamic Experiments Achieved with the Design of an In-plane Magnetic Field Specimen Holder

In-Situ Focused Ion Beam Micropatterning of Ge Islands

Invited Papers

Surface Damages on FIB prepared TEM-Specimens: Possibilities of Avoidance and Removal

Abstract

Magnetic domain wall energies in Fe/Cu(100) measured from direct observations of thermal fluctuations using SPLEEM

Invited Papers

Usage of Segmental Ionization Detector in Environmental Conditions

Nanosecond Transmission Electron Microscopy: A New Probe for Laser Pulse-Induced Transient Plasmas

Microscopy and Microanalysis

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Volume 9 - August 2003

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Invited Papers

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Invited Papers

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Invited Papers

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