Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Invited Papers

EDX and Cathodoluminecence Depth Analysis in Ion-implanted SiO2 Layers

New Detection Principles on the GEMINI SUPRA FE-SEM

Abstract

A TEM Analysis of Particulates in a Polar Ice Core

Invited Papers

Efficiency of Collection of the Secondary Electrons in SEM

Abstract

TEM Study of Nano-Crystalline Al-Ni-La Powders Obtained by Gas Atomization

Effects Of Sample Preparation In Analysis: Imaging

Invited Papers

MONCA: A New MATLAB Package for Monte Carlo Simulation of Electron Scattering in Thin Specimens in the Energy Range 10 – 200 keV

MASDET: A New MATLAB Package for Mass Determination of Matter Using Transmitted Scattered Electrons

Abstract

Effects of Sample Preparation in Analysis: Spectroscopy

Invited Papers

Kossel X-ray Microdiffraction and EBSD as Complementary Methods in the SEM

Abstract

Specimen Preparation of Difficult Materials with Patterned Dimpling Wheels

Invited Papers

Computer Controlled Low Energy SEM

Abstract

Implementing Spectral Deconvolution into the Spectrum-Imaging Mode : A New Step Towards Combined High Spatial and Energy-Resolution EELS

Invited Papers

Quantitative 3D-Analyses in SEM: A Review

Abstract

Quantitative atomic-scale profiles of oxygen vacancies in SrTiO3

Materials Science Applications Of A Monochromated TEM

Invited Papers

Contrast Mechanisms in the Scanning Low Energy Electron Microscopy

Abstract

Evolution of Surface Morphology during Focused Ion Beam Sputtering and Gas-assisted Sputtering Processes

Invited Papers

Aberration correction combined with energy filtering: the SMART spectromicroscopy project

The orientation-dependent growth of epitaxial silicon layers at low temperature

Microscopy and Microanalysis

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Volume 9 - August 2003

Invited Papers

Abstract

Invited Papers

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Invited Papers

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Invited Papers

Abstract

Invited Papers

Abstract

Invited Papers

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Invited Papers

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Invited Papers