Microscopy and Microanalysis: Volume 9 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 9 - August 2003

Abstract

Experience with the IBM Sub-Angstrom STEM

New Possibility of Direct Observations of Quantum Dots, Nanotubes and Interfaces by Cs-Corrected HRTEM

Invited Papers

Broad Ion Beam Grid Cutting with Gatan PECS for 3D Scanning Electron Microscopy and Microanalysis of Integrated Circuits and Layered Structures

Advantages of Broad Ion Beam (BIB) Processing Compared with Focused Ion Beam (FIB) Technology for 3D Investigation of Heterogeneous Solids

Abstract

Direct Determination of Imaging Parameters from Wave Functions in HRTEM

Invited Papers

A Rugged Cathode for Photoelectron and DC Thermionic Operation

Abstract

Low Energy STEM of Multi-Layers and Dopant Profiles

Invited Papers

Fluctuation Electron Microscopy on a-Ge and Polycrystalline Gold

Abstract

The Versatile FEG-SEM: From Ultra-High Resolution To Ultra-High Surface Sensitivity

Recent development of an UHR and ULV FE-SEM with various signal detection capabilities and its applications

Invited Papers

Time-resolved PEEM of Laser Treated Metal Films

Optimization of Poly-(Methylphenylsilylene) Specimens for Cathodoluminescence Measurement

Abstract

Examining the Possibilities and Pitfalls of Three Dimensional Energy Filtered Transmission Electron Microscopy (3D-EFTEM)

Computationally Mediated Experimental Science

Invited Papers

Improving the X-Ray Fluorescence Analysis in the SEM

Abstract

Automated analysis of large (>4Gb) spectral images with efficient out-of-core- RAM algorithms

Invited Papers

Unified Quantification of X-Ray Emission Spectra with Monte-Carlo methods

Topographic Measurements of Real Structures in reflection Confocal Laser Scanning Microscope (CLSM)

Abstract

TEM Specimen Preparation for Integrated Circuits - Challenges and Solutions

Invited Papers

Plasma cleaning of carbonaceous samples using a shield

Microscopy and Microanalysis

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Volume 9 - August 2003

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