Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract

In-Depth Sample Analysis with a Signal-Selective SEM Detection System

Image Sharpness Measurement in Scanning Electron Microscopy Based On Derivative Method In ISO/TS 24597 document

A Static Low Energy Ion Source for Local Surface Modification

“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

The Determination of Lattice Parameters Using Single EBSD Patterns

Practical Considerations for High-Resolution Transmission Kikuchi Diffraction Mapping and Analysis in Titanium Alloys

EDS Windows and Plasma Cleaning: Characterization and Damage Mechanisms

The Study of “Window-less” EDS Detector With Low Voltage FE-SEM

Research and Applications in Atom Probe Tomography

Abstract

On the Accuracy of Compositional Quantification for Atom Probe Tomography

Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries

Atom Probe Tomography of Interfacial Segregation in CdTe-based Solar Cells

Experimental Evaluation of the Interrelationships Between Laser Energy, Temperature, Applied Bias, and Measured Composition in Laser Pulsed Atom Probe Tomography

Assessing the Composition of Wide Bandgap Compound Semiconductors by Atom Probe Tomography: A Metrological Problem

Mapping Isotopes in Nanoscale and Quantum Materials Using Atom Probe Tomography

Correlated Atom-Probe Tomography and Transmission Electron Microscopy of Meteoritic Nanodiamonds

Oxide Scales Revealed by Atom Probe Tomography.

The Mystery of Missing Species in Atom Probe Tomography of Composite Materials

Impact of Extreme Electrical Fields on Charge Density Distributions in Alloys

Dissociation of Molecular Ions During the DC Field Evaporation ZnO in Atom Probe Tomography

Approaches for Promoting Accurate Atom Probe Reconstruction

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Advances in Scanning Electron/Ion Instrumentation and Detectors

Abstract

Research and Applications in Atom Probe Tomography

Abstract