Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-27T14:39:12.108Z Has data issue: false hasContentIssue false
  • English
  • Français

Approaches for Promoting Accurate Atom Probe Reconstruction

Published online by Cambridge University Press:  25 July 2016

T.J. Prosa ,
B.P. Geiser ,
D. Reinhard ,
Y. Chen  and
D.J. Larson
T.J. Prosa
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
B.P. Geiser
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
D. Reinhard
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
Y. Chen
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA
D.J. Larson
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 664 - 665
Copyright
© Microscopy Society of America 2016 

References

[1] Bas, P., et al, Appl. Surf. Sci 87/88 (1995). p. 298.Google Scholar
[2] Geiser, B.P., et al, Microsc. Microanal 15(S2 (2009). p. 292.Google Scholar
[3] Larson, D.J., et al, in "Local Electrode Atom Probe Tomography". Springer, New York (2013).Google Scholar
[4] Prosa, T.J., et al, Ultramicroscopy 132 (2013). p. 179.Google Scholar
[5] Gault, B., et al, Microsc. Microanal 14 (2008). p. 296.Google Scholar
[6] Geiser, B.P., et al, Microsc. Microanal 13 (2007). p. 437.CrossRefGoogle Scholar
[7] Vurpillot, F., et al, Ultramicroscopy 132 (2013). p. 19.CrossRefGoogle Scholar