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“Smart Microscopy”: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 632 - 633
- Copyright
- © Microscopy Society of America 2016
References
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Dahmen, Tim, et. al., Feature Adaptive Sampling for Scanning Electron Microscopy, under review Nature: Scientific Reports.Google Scholar
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[4] The authors acknowledge funding from European Research Project NOTOX (FP7-267038), the DFG grant IMCL (AOBJ: 600875) and the “Landesforschungsforderungsprogramm des Saarlandes” (WT/2- LFFP 15/09). The authors thank the DFKI GmbH, and Saarland University for additional funding and for providing the necessary infrastructure, and E. Arzt for his support through INM.Google Scholar
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