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Semi-statistical Atom Probe Tomography Analysis of Thin Film Grain Boundaries

Published online by Cambridge University Press:  25 July 2016

Adam Stokes
Affiliation:
Colorado School of Mines, Material Science, Golden, COUSA. National Renewable Energy Laboratory, National Center for Photovoltaics, Golden CO, USA.
Mowafak Al-Jassim
Affiliation:
National Renewable Energy Laboratory, National Center for Photovoltaics, Golden CO, USA.
Brian Gorman
Affiliation:
Colorado School of Mines, Material Science, Golden, COUSA.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Green, M. A., et al., Progress in Photovoltaics (pp 19, 2015.Google Scholar
[2] Choi, P.-P., et al., J. Appl. Phys. vol. 110(no. 12 p. 124513 (2011).CrossRefGoogle Scholar
[3] Cojocaru-mir, O., et al., IEEE J. Photovoltaics vol. 1 no. 2, pp.207212, 2011.CrossRefGoogle Scholar
[4] Keller, J., et al., Sol. Energy Mater. Sol. Cells vol. 117, pp 592598, Oct. 2013.CrossRefGoogle Scholar
[5] Thompson, K., et al., Ultramicroscopy vol. 107 no. 2-3, pp.131139, 2007.Google Scholar
[6] Gorman, B. P., et al., Microscopy Today 16, pp 4248, 2008.CrossRefGoogle Scholar