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Practical Considerations for High-Resolution Transmission Kikuchi Diffraction Mapping and Analysis in Titanium Alloys

Published online by Cambridge University Press:  25 July 2016

Jonathan Orsborn ,
Genevieve Lee ,
S. A. Romo ,
Thomas F. Broderick ,
Antonio J. Ramirez ,
David W. McComb  and
Hamish L. Fraser
Jonathan Orsborn
Affiliation:
Center for the Accelerated Maturation of Materials, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH
Genevieve Lee
Affiliation:
Welding Engineering Program, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH
S. A. Romo
Affiliation:
Welding Engineering Program, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH
Thomas F. Broderick
Affiliation:
G.E. Aviation, Materials Process Engineering Department, One Neumann Way, Cincinnati, OH
Antonio J. Ramirez
Affiliation:
Welding Engineering Program, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH
Hamish L. Fraser
Affiliation:
Center for the Accelerated Maturation of Materials, Department of Materials Science and Engineering, The Ohio State University, Columbus, OH

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 636 - 637
Copyright
© Microscopy Society of America 2016 

References

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