Analytical and Instrumentation Science Symposia
Applications of Correlative Microscopy to Physical and Biological Sciences
Abstract
Correlative Characterization of Graphene with the Linkage of SEM and KFM
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- 25 July 2016, pp. 226-227
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Correlative Isotopic Analysis by Image Fusion of Electron Microscopy and Secondary Ion Mass Spectrometry Data
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- 25 July 2016, pp. 228-229
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Correlative Light and Electron Microscopy in Atmosphere
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- 25 July 2016, pp. 230-231
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Correlative Fluorescence and Scanning Electron Microscope Imaging of Cultured Neurons Pretreated with Ionic Liquid
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- 25 July 2016, pp. 232-233
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The Effects of Chemical Fixation on the Cellular Nanostructure: A Correlative Study of Back-Scattered Interference Spectrometry Microscopy and TEM
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- 25 July 2016, pp. 234-235
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Processing a Biological Tissue from Cryo-SEM to Replica
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- 25 July 2016, pp. 236-237
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Linking Length Scales and Modalities with Integrated, Correlative Microscopy
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- 25 July 2016, pp. 238-239
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Learning From Scanning Transmission Electron Microscopy to Enhance Transmission X-ray Microscopy: How We Can Merge STEM and TXM Datasets?
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- 25 July 2016, pp. 240-241
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Correlative NanoSIMS and Atom Probe Study of Nacre: Toward Understanding Polymorphism Effects in a Chinese Pearl
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- 25 July 2016, pp. 242-243
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Advancements in Interfaced SEM and Raman Spectromicroscopy (μRS)
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- 25 July 2016, pp. 244-245
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Correlative Light and Electron Microscopy (CLEM) Utilizing Hitachi HILEMTMIL1000 Ionic Liquid
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- 25 July 2016, pp. 246-247
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A New Solution of Non-integrated Correlative Light and Electron Microscopy Based on High-vacuum Optical Platform
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- 25 July 2016, pp. 248-249
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Morphology and Composition of Biomineralized Ceria and Ceria-Zirconia Nanocrystals
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- 25 July 2016, pp. 250-251
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Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis
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Fast Aberration Measurement in Multi-Dimensional STEM
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- 25 July 2016, pp. 252-253
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Application of High Speed Cameras for 4D Data Collection in S/TEM
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- 25 July 2016, pp. 254-255
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Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera
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- 25 July 2016, pp. 256-257
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Reverse Engineering Cadmium Yellow Paint from Munch’s “The Scream” with Correlative 3-D Spectroscopic and 4-D Crystallographic STEM
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- 25 July 2016, pp. 258-259
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Simultaneous DualEELS and EDS Analysis Across the Ohmic Contact Region in FinFET Electronic Devices - Exploring the Effects of Electron Beam Damage
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- 25 July 2016, pp. 260-261
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Detection of oxygen sub-lattice ordering in A-site deficient perovskites through monochromated core-loss EELS mapping
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- 25 July 2016, pp. 262-263
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Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed With K and L Electrons Using STEM-Moiré Method
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- 25 July 2016, pp. 264-265
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