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Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera

Published online by Cambridge University Press:  25 July 2016

M. Huth ,
S. Ihle ,
R. Ritz ,
M. Simson ,
H. Soltau ,
V. Migunov ,
M. Duchamp ,
R.E. Dunin-Borkowski ,
H. Ryll  and
L. Strüder
M. Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany
S. Ihle
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany
R. Ritz
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany
M. Simson
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, Munchen, Germany
V. Migunov
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, FZJ, Jülich, Germany
M. Duchamp
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, FZJ, Jülich, Germany
R.E. Dunin-Borkowski
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, FZJ, Jülich, Germany
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, München, Germany
L. Strüder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, München, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 256 - 257
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Ryll, H., et al., Microscopy and Microanalysis 19 (2013). p. 1160–1161.Google Scholar
[2] Ryll, H., et al., Microscopy and Microanalysis 21(Suppl. 3 (2015). p. 1585–1586.Google Scholar
[3] Müller, K., et al., Appl. Phys. Lett. 101 (2012). p. 2121101–2121104.Google Scholar
[4] Yang, H., et al, Microscopy and Microanalysis 21(Suppl. 3 (2015). p. 2303–2304.CrossRefGoogle Scholar