Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract

Unveiling Complex Plasmonic Resonances in Archimedean Nanospirals through Cathodoluminescence in a Scanning Transmission Electron Microscope

Visualizing Interface Effects in Two-dimensionally Doped La2CuO4 and La2CuO4/ La2-xSrxNiO4 Superlattices

Connecting Phase Stability to the Grain Growth Behavior of Ni-W Alloys

Novel Characterization of Deformation Mechanisms in a Ni-base Superalloy Using HAADF Imaging and Atomic Ordering Analysis

Spectral Electron Tomography as a Quantitative Technique to Investigate Functional Nanomaterials

Automated 3D EDS Acquisition for Spatially Resolved Elemental Characterization of Catalyzed MgH2 Nanostructures

Quantitative Measurements of the Penumbra of XEDS Systems in an AEM

Characterization of VLSI Processing Defects Using STEM-EELS Tomography

Multidimensional Analysis of Nanoscale Phase Separation in Complex Materials Systems

Improved Data Analysis and Reconstruction Methods for STEM-EDX Tomography

Quantifying the Advantages of Compressive Sensing and Sparse Reconstruction for Scanning Transmission Electron Microscopy

High Performance Computing Tools for Cross Correlation of Multi-Dimensional Data Sets Across Instrument Platforms

The Enabler Framework: an Object-Oriented Toolkit for Microscopy Data Analysis

Using Multivariate Analysis of Scanning-Rochigram Data to Reveal Material Functionality

Plasmons in Mesoscopic Gold Tapers

Temperature Dependence of the Volume Plasmon in Silicon Nanoparticles

Hyperspectral Imaging of Surface-Plasmon-Enhanced Local Electric Fields by EELS with Tunable <60meV Energy Resolution

Unveiling Nanometric Plasmons Optical Properties With Advanced Electron Spectroscopy in the Scanning Transmission Electron Microscope

Strategies for Obtaining High Spatial Resolution in Imaging and Spectroscopy of Beam-sensitive TEM Specimens

Quantitative Annular Dark-Field Imaging at Atomic Resolution

Microscopy and Microanalysis

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Volume 22 - February 2016

Analytical and Instrumentation Science Symposia

Analytical Electron Microscopy for Advanced Characterization from Multi-Dimensional Data Acquisition to Integrated Analysis

Abstract