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Volume 15 - April 2009

Contents

Page 11 of 47

Biological Sciences

Live Cell Imaging

Abstract

  • Reversible Cycles of Mitochondrial Remodelling in Differentiated PC12 Cells: Implications for Neuronal Survival

  • P Kaifosh, N Shulyakova, D Diec, J Fong, LR Mills
  • Published online by Cambridge University Press:
    26 July 2009, pp. 98-99
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Microbiology

Abstract

  • Observation of Virus-Like Particles in Vascular and Coelomic Hemolymph of Riftia pachyptil

  • RR Helton, DH Powell, SC Cary, SW Polson, KJ Czymmek
  • Published online by Cambridge University Press:
    26 July 2009, pp. 100-101
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Pathology

Abstract

  • A Suspicious Facial Lesion - A Unique Opportunity to Test the North Carolina Laboratory Response Network

  • PS Christopher, JR Saah, SE Miller
  • Published online by Cambridge University Press:
    26 July 2009, pp. 102-103
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Ultrastructure (Cells, Tissues, and Organ Systems)

Abstract

  • Stem Cell Activation During Hair Regeneration

  • V Greco, HA Pasolli, T Chen, E Fuchs
  • Published online by Cambridge University Press:
    26 July 2009, pp. 104-105
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Physical Sciences

Ferroelectrics, Ceramics and Oxides

Abstract

  • Variable-temperature EELS Study of Magnetic Transitions in LaCoO3 Thin Films

  • RF Klie, G Yang, QM Ramasse, A-B Posadas, C Ahn
  • Published online by Cambridge University Press:
    26 July 2009, pp. 108-109
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • The Atomic Structure of Oxide Superlattices Revealed by Fine Electron Probes

  • A Shah, QM Ramasse, S May, T Santos, J-G Wen, X Zhai, J Eckstein, A Bhattacharya, J-M Zuo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 110-111
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Magnetic, Semiconducting and Superconducting Materials

Abstract

  • Electron Microscopy Characterization of Fe-Ga and Fe-Si-B Fine Particles

  • VC Solomon, DJ Smith, J-I Hong, AE Berkowitz
  • Published online by Cambridge University Press:
    26 July 2009, pp. 112-113
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Application of Lattice Strain Analysis of Semiconductor Device by Nano-beam Diffraction Using the 300 kV Cold-FE TEM

  • T Sato, H Matsumoto, M Konno, M Fukui, I Nagaoki, Y Taniguchi
  • Published online by Cambridge University Press:
    26 July 2009, pp. 114-115
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Metals and Alloys

Abstract

  • Microstructure and Mechanical Behavior in Spinodal Fe35Ni15Mn25Al25 Alloy

  • X Wu, I Baker, MK Miller, KL More
  • Published online by Cambridge University Press:
    26 July 2009, pp. 116-117
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Instrumentation and Techniques

Transmission Electron Microscopy & Scanning Transmission Electron Microscopy

Abstract

  • Alignment Control of STEM a Ronchigram Based Approach

  • SW van der Hoeven, AJ den Dekker, A Tejada
  • Published online by Cambridge University Press:
    26 July 2009, pp. 118-119
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • A Transmission Positron Microscope

  • T Ootsuka, M Inoue, M Matsuya, T Kurihara, M Doyama, T Oka, S Jinno, M Fujinami
  • Published online by Cambridge University Press:
    26 July 2009, pp. 120-121
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

  • K Suenaga, Y Sato, Z Liu, M Koshino, C Jin
  • Published online by Cambridge University Press:
    26 July 2009, pp. 122-123
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Atomic Resolution Imaging and Spectroscopy of Graphene Using the TEAM 0.5

  • Z Lee, A Dato, K-J Jeon, R Erni, T Richardson, M Frenklach, V Radmilovic
  • Published online by Cambridge University Press:
    26 July 2009, pp. 124-125
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Electron Microscopic Studies with Graphene

  • J Meyer, A Chuvilin, U Kaiser
  • Published online by Cambridge University Press:
    26 July 2009, pp. 126-127
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • HRTEM Study of Lithographically Defined Silicon Nanowires

  • HC Floresca, K Trivedi, SJ Kang, W Hu, MJ Kim
  • Published online by Cambridge University Press:
    26 July 2009, pp. 128-129
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applications of High-Resolution Aberration-Corrected STEM Imaging to Studies of the Behavior of Nanophase Materials at Elevated Temperatures

  • LF Allard, KL More, J Liu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 130-131
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Structural Analysis of Nanoparticles in Thermoelectric AgPb18SbTe20 Single Crystal

  • L Wu, J Zhou, J Zheng, Q Jie, Q Li, J Yang, Y Zhu
  • Published online by Cambridge University Press:
    26 July 2009, pp. 132-133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Determination of the 3-D Magnetic Vector Potential using Lorentz Transmission Electron Microscopy

  • C Phatak, E Humphrey, M DeGraef, A Petford-Long
  • Published online by Cambridge University Press:
    26 July 2009, pp. 134-135
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Imaging Shape Dependent Surface Plasmon Modes in Noble Metal Nanoparticles

  • S Aloni, Y Yin, AP Alivisatos
  • Published online by Cambridge University Press:
    26 July 2009, pp. 136-137
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 11 of 47