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Alignment Control of STEM a Ronchigram Based Approach

Published online by Cambridge University Press:  26 July 2009

SW van der Hoeven ,
AJ den Dekker  and
A Tejada
SW van der Hoeven
Affiliation:
Delft University of Technology,Netherlands
AJ den Dekker
Affiliation:
Delft University of Technology,Netherlands
A Tejada
Affiliation:
Delft University of Technology,Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 118 - 119
Copyright
Copyright © Microscopy Society of America 2009