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Electron Microscopy Characterization of Fe-Ga and Fe-Si-B Fine Particles

Published online by Cambridge University Press:  26 July 2009

VC Solomon ,
DJ Smith ,
J-I Hong  and
AE Berkowitz
VC Solomon
Affiliation:
University of Connecticut
DJ Smith
Affiliation:
Arizona State University
J-I Hong
Affiliation:
Georgia Institute of Technology
AE Berkowitz
Affiliation:
University of California,San Diego

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 112 - 113
Copyright
Copyright © Microscopy Society of America 2009