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Volume 15 - April 2009

Contents

Page 12 of 47

Physical Sciences

Microscopy and Microanalysis of Nanostructured Materials

Abstract

  • Imaging of GaAs Nanowire Using Combined Aberration-corrected TEM/STEM and Exit Wave Restoration

  • L-Y Chang, S Lazar, B Bártová, GA Botton, C Hébert, A Fontcuberta i Morral
  • Published online by Cambridge University Press:
    26 July 2009, pp. 138-139
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Irradiation Damage and Modifications of Materials

Abstract

  • Nanoparticles and Nanopores Induced by High-energy Electron Irradiation

  • N Jiang, S Dong, JCH Spence
  • Published online by Cambridge University Press:
    26 July 2009, pp. 140-141
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Ion Irradiation-Induced Changes in Surface Morphology of InSb

  • A Perez-Bergquist, X Xiang, Y Zhang, L Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 142-143
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Characterization of Materials for Responsible Energy Generation and Use

Abstract

  • Nanowires for Energy Applications: Fundamental Growth Studies

  • AF Marshall, IA Goldthorpe, M Koto, PC McIntyre, J Zhu, H Peng, DM Barnett, WD Nix, Y Cui
  • Published online by Cambridge University Press:
    26 July 2009, pp. 144-145
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Pt-Co Bimetallic Catalysts for PEM Fuel Cell Cathodes

  • KL More, KS Reeves, R Borup
  • Published online by Cambridge University Press:
    26 July 2009, pp. 146-147
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Microstructural Characterization of CdTe and CIGS Thin Film Solar Cells by Analytical Transmission Electron Microscopy

  • U Sharma, D Susnitzky
  • Published online by Cambridge University Press:
    26 July 2009, pp. 148-149
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy

Abstract

  • Development of Correctors: From O. Scherzer to TEAM

  • M Haider, P Hartel, H Müller, S Uhlemann, J Zach
  • Published online by Cambridge University Press:
    26 July 2009, pp. 150-151
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?

  • AL Bleloch, M Gass, B Mendis, K Sader, B Schaffer, P Wang
  • Published online by Cambridge University Press:
    26 July 2009, pp. 152-153
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

  • S Lazar, L-Y Chang, L Gunawan, Y Shao, GA Botton
  • Published online by Cambridge University Press:
    26 July 2009, pp. 154-155
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

ArcheoMetallurgy: Analyses & Characterization

Abstract

  • Puddled or Forged? A Steel Bar in the Cathedral of México, from the XVIII Century

  • ME Noguez, D Mojica, R Sanchez, T Robert
  • Published online by Cambridge University Press:
    26 July 2009, pp. 156-157
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Steel Hull Corrosion of USS Arizona with Applications to Submerged Resources

  • DL Johnson, DJ Medlin, M Russell, DL Conlin, LE Murphy, JD Carr
  • Published online by Cambridge University Press:
    26 July 2009, pp. 158-159
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Instrumentation and Techniques

IMS Henry Clifton Sorby Award and Lecture

Abstract

  • Characteristics of Exfoliation Corrosion at Weldments in an Al-Zn-Mg Alloy

  • C Bagnall
  • Published online by Cambridge University Press:
    26 July 2009, pp. 160-161
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Exhibitor Symposium: Making the Nano-Future Real: Instruments and Techniques that are Impacting Todays Research for Tomorrows Breakthroughs

Abstract

  • Microwave Radiation is a Versatile Technology for Tissue Processing

  • RT Giberson
  • Published online by Cambridge University Press:
    26 July 2009, pp. 162-163
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy

  • E Okunishi, I Ishikawa, H Sawada, F Hosokawa, M Hori, Y Kondo
  • Published online by Cambridge University Press:
    26 July 2009, pp. 164-165
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Development of a Fast CCD Camera for Electron Diffraction Imaging in Conventional TEM

  • B Mollon, M Pan, Y Jia, P Mooney, T Sha
  • Published online by Cambridge University Press:
    26 July 2009, pp. 166-167
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Versatile Monochromator Module for XHR SEM

  • A Henstra, J Chmelik, T Dingle, A Mangnus, G van Veen
  • Published online by Cambridge University Press:
    26 July 2009, pp. 168-169
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System

  • H Stegmann, Y Ritz, D Utess, H-J Engelmann, E Zschech
  • Published online by Cambridge University Press:
    26 July 2009, pp. 170-171
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • X-Max Large Area SDD Detectors - Creating a Real Impact on Nano-Science

  • CL Collins, J Holland, SR Burgess, N Rowlands
  • Published online by Cambridge University Press:
    26 July 2009, pp. 172-173
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)

  • TS Nunney, O Mustonen, RG White
  • Published online by Cambridge University Press:
    26 July 2009, pp. 176-177
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Page 12 of 47