Microscopy and Microanalysis: Volume 16 -

Future Prospects for SEM-based Defect Analysis using Fast Electrons
YN Picard, RJ Kamaladasa, N Kumar, C Trager-Cowan, W Jiang, M Skowronski, PA Salvador, H Behmemburg, C Giesen, AP Day, G England
Published online by Cambridge University Press:

01 August 2010, pp. 608-609
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope
H Inada, D Su, M Konno, K Nakamura, RF Egerton, J Wall, Y Zhu
Published online by Cambridge University Press:

01 August 2010, pp. 610-611
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Quantitative Analysis by Electron Transmission Measurements in a Scanning Electron Microscope
E Müller, T Volkenandt, DZ Hu, DM Schaadt, D Gerthsen
Published online by Cambridge University Press:

01 August 2010, pp. 612-613
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM
JR Michael, DC Joy, BJ Griffin
Published online by Cambridge University Press:

01 August 2010, pp. 614-615
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Study of the Signal Information by ULV-SEM in Ultra Low Landing Voltage
S Takeuchi, A Miyaki, A Muto, S Okada, M Hatano, S Ito
Published online by Cambridge University Press:

01 August 2010, pp. 616-617
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Capturing Die Layout of Obsolete ASIC Using Extreme Field of View SEM
J Gazda, A Jachniewicz, C Sallee, R Young
Published online by Cambridge University Press:

01 August 2010, pp. 618-619
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Physics of Atomic-Scale Secondary-Electron Imaging
RF Egerton, D Su, J Wall, Y Zhu
Published online by Cambridge University Press:

01 August 2010, pp. 620-621
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Advantages of Energy Selective Secondary Electron Detection in SEM
C Rodenburg, MAE Jepson, E Bosch
Published online by Cambridge University Press:

01 August 2010, pp. 622-623
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

A Comparison of a Luminescence-based VPSE and an Electron-based GSED for SE and CL Imaging in Variable Pressure SEM with Conventional SE imaging
BJ Griffin, JR Michael, DC Joy
Published online by Cambridge University Press:

01 August 2010, pp. 624-625
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Low Voltage Imaging and X-Ray Microanalysis in the FE-SEM
R Gauvin
Published online by Cambridge University Press:

01 August 2010, pp. 626-627
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques
C Schamp, BT Valdez, LK Ballast, A Gill, SA Pierce, L Brown, C Brooks, E Thompson, B Roth
Published online by Cambridge University Press:

01 August 2010, pp. 628-629
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Imaging Dynabeads with the Scanning Electron Microscope
JG Ault, K Tuz, B Shi, J Walsh, A Andreas, E Shimakawa, RJ Ferland
Published online by Cambridge University Press:

01 August 2010, pp. 630-631
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Surface Sensitive and Compositional SEM Imaging for High Accelerating Voltages in Focused Ion/Electron Beam Systems
T Agemura, T Nomaguchi, T Onishi
Published online by Cambridge University Press:

01 August 2010, pp. 632-633
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microscopy and Chemical Inversing Techniques to Determine the Photonic Crystal Structure of Iridescent Beetle Scales in the Cerambycidae Family
LR Richey, JS Gardner, MD Standing, MR Jorgensen, MH Bartl
Published online by Cambridge University Press:

01 August 2010, pp. 634-635
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Application of Microscopy in Pharmaceutical Development from Discovery to Manufacture Process Scale-up
MS Ku, JQ Liang, D Lu
Published online by Cambridge University Press:

01 August 2010, pp. 636-637
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Characterization of Substrate-Active Ingredient Interactions using In Situ Microscopy
GA Camacho-Bragado, FM Dixon
Published online by Cambridge University Press:

01 August 2010, pp. 638-639
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Forensic Science in the Pharmaceutical Industry – A Microscopy Perspective
JA Reffner
Published online by Cambridge University Press:

01 August 2010, pp. 640-641
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Application of 2D and 3D Optical Microscopy in the Examination of Suspect Counterfeit Pharmaceutical Tablets
SF Platek, N Ranieri, DC Albright, MW Witkowski
Published online by Cambridge University Press:

01 August 2010, pp. 642-643
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Insight into the Mechanism of Defensin Neutralization from CryoEM Structural Studies
PL Stewart, JG Smith, M Silvestry, S Lindert, W Lu, GR Nemerow
Published online by Cambridge University Press:

01 August 2010, pp. 644-645
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Tanespimycin Protects Cultured Rat Dorsal Root Ganglia from Bortezmib Toxicity
J Megill, O Flint, J Kwagh, F Wang, C Storck, F Moulin, J Oberdoerster, D Berman, B Car
Published online by Cambridge University Press:

01 August 2010, pp. 646-647
- Article
- - You have access
- PDF
- Export citation
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 16 - July 2010

Instrumentation and Techniques Symposia

Slow Electrons, Fast Ions: How Well Do We Image and What Do We Image With Scanning Beam Microscopy?

Abstract

Future Prospects for SEM-based Defect Analysis using Fast Electrons

Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope

Quantitative Analysis by Electron Transmission Measurements in a Scanning Electron Microscope

Use of Sample Bias Voltage for Low-Energy High-Resolution Imaging in the SEM

A Study of the Signal Information by ULV-SEM in Ultra Low Landing Voltage

Capturing Die Layout of Obsolete ASIC Using Extreme Field of View SEM

Physics of Atomic-Scale Secondary-Electron Imaging

Advantages of Energy Selective Secondary Electron Detection in SEM

A Comparison of a Luminescence-based VPSE and an Electron-based GSED for SE and CL Imaging in Variable Pressure SEM with Conventional SE imaging

Low Voltage Imaging and X-Ray Microanalysis in the FE-SEM

SEM Imaging of Resist Patterns Fabricated Through Imprint Lithography Techniques

Imaging Dynabeads with the Scanning Electron Microscope

Surface Sensitive and Compositional SEM Imaging for High Accelerating Voltages in Focused Ion/Electron Beam Systems

Microscopy and Chemical Inversing Techniques to Determine the Photonic Crystal Structure of Iridescent Beetle Scales in the Cerambycidae Family

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract

Application of Microscopy in Pharmaceutical Development from Discovery to Manufacture Process Scale-up

Characterization of Substrate-Active Ingredient Interactions using In Situ Microscopy

Forensic Science in the Pharmaceutical Industry – A Microscopy Perspective

Application of 2D and 3D Optical Microscopy in the Examination of Suspect Counterfeit Pharmaceutical Tablets

Insight into the Mechanism of Defensin Neutralization from CryoEM Structural Studies

Tanespimycin Protects Cultured Rat Dorsal Root Ganglia from Bortezmib Toxicity

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 16 - July 2010

Instrumentation and Techniques Symposia

Slow Electrons, Fast Ions: How Well Do We Image and What Do We Image With Scanning Beam Microscopy?

Abstract

Microscopy, Microanalysis and Image Analysis in the Pharmaceutical Sciences

Abstract