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Volume 16 - July 2010

Contents

Page 22 of 57

Instrumentation and Techniques Symposia

Imaging Fields with Holography

Abstract

  • Application of Electron Holography to Semiconductor Structures and Devices

  • MA Gribelyuk, V Ontalus, KT Schonenberg, J Yuan, TN Adam, P Ronsheim
  • Published online by Cambridge University Press:
    01 August 2010, pp. 568-569
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Field Mapping and Ohmic Contacts for AlGaN- or AlInN-Based Heterojunction Field Effect Transistors

  • L Zhou, DA Cullen, JH Leach, X Ni, H Morkoç, DJ Smith, MR McCartney
  • Published online by Cambridge University Press:
    01 August 2010, pp. 570-571
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Dynamical Effects in the Study of Supported Nanocrystals using Electron Holography

  • RE Dunin-Borkowski, CB Boothroyd, M Beleggia
  • Published online by Cambridge University Press:
    01 August 2010, pp. 572-573
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Direct Observation of Magnetic Domain Wall Propagation in NiFe Nanowires

  • K He, DJ Smith, MR McCartney
  • Published online by Cambridge University Press:
    01 August 2010, pp. 574-575
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Direct Observation of Nanoscale Magnetization Reversal and Spin Dynamics Using In-Situ Lorentz Microscopy and Electron Holography

  • L Huang, Y Zhu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 576-577
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Coherent Electron Interference of Diffracted Beams from Amorphous Materials

  • RA Herring, K Saitoh, N Tanaka, T Tanji
  • Published online by Cambridge University Press:
    01 August 2010, pp. 578-579
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Using Off-axis Type Holography for CCD Camera Characterization

  • E Voelkl
  • Published online by Cambridge University Press:
    01 August 2010, pp. 580-581
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Mapping Intrinsic Electric Fields Through Off-Axis Electron Holography: Prospects and Problems

  • F Röder, D Wolf, A Lubk, M Linck, K Vogel, A Lenk, K Tsuda, H Lichte
  • Published online by Cambridge University Press:
    01 August 2010, pp. 582-583
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Optimizing Phase Resolution for Off-Axis-Type Holograms at 2π/1000 Levels

  • E Voelkl, D Tang
  • Published online by Cambridge University Press:
    01 August 2010, pp. 584-585
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • On Almost Double Resolution Improvement for Off-Axis Electron Holography

  • VV Volkov, MA Schofield, YM Zhu
  • Published online by Cambridge University Press:
    01 August 2010, pp. 586-587
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • New Electron Holographic Technique for the Measurement of Strain at the Nanoscale: Application to Electronic Devices and Multilayers

  • E Snoeck, F Houdellier, F Hüe, MJ Hÿtch
  • Published online by Cambridge University Press:
    01 August 2010, pp. 588-589
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Strain Mapping on Semiconductor Device by Dark Field Electron Holography

  • YY Wang, J Li, J Bruley, A Domenicucci, D Cooper, R Jean-Luc
  • Published online by Cambridge University Press:
    01 August 2010, pp. 590-591
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Strain Mapping of 45 nm MOSFET by Dark-Field Inline Electron Holography

  • VB Özdöl, CT Koch, PA van Aken
  • Published online by Cambridge University Press:
    01 August 2010, pp. 592-593
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Slow Electrons, Fast Ions: How Well Do We Image and What Do We Image With Scanning Beam Microscopy?

Abstract

  • Low Voltage SEM Characterization of Ceramic Aerogel

  • CA Wisner
  • Published online by Cambridge University Press:
    01 August 2010, pp. 594-595
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Scanning Electron Microscopy: Bridging the Gap from Stem Cells to Hydrogels

  • L-M Joubert
  • Published online by Cambridge University Press:
    01 August 2010, pp. 596-597
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Caught between Ions and Electrons - the Best of Helium Ion Microscopy

  • DC Bell
  • Published online by Cambridge University Press:
    01 August 2010, pp. 600-601
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Helium Ion Microscopy for the Characterization of Complex 3D Structures in a C/CrC Nanocomposite

  • Z Zhou, MAE Jepson, X Liu, WM Rainforth, C Rodenburg
  • Published online by Cambridge University Press:
    01 August 2010, pp. 602-603
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Scanning Transmission Ion Microscopy and Diffraction Imaging

  • DC Joy, J Notte IV, R Hill, SM McVey, R Ramachandra, BJ Griffin
  • Published online by Cambridge University Press:
    01 August 2010, pp. 604-605
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Starting a Revolution: A New Approach to Scanning Beam Microscopy

  • LG Lechner
  • Published online by Cambridge University Press:
    01 August 2010, pp. 606-607
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Page 22 of 57