Hostname: page-component-7bb8b95d7b-5mhkq Total loading time: 0 Render date: 2024-10-02T00:20:06.540Z Has data issue: false hasContentIssue false
  • English
  • Français

Physics of Atomic-Scale Secondary-Electron Imaging

Published online by Cambridge University Press:  01 August 2010

RF Egerton ,
D Su ,
J Wall  and
Y Zhu
RF Egerton
Affiliation:
University of Alberta, Canada
D Su
Affiliation:
Brookhaven National Laboratory
J Wall
Affiliation:
Brookhaven National Laboratory
Y Zhu
Affiliation:
Brookhaven National Laboratory

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 620 - 621
Copyright
Copyright © Microscopy Society of America 2010