Microscopy and Microanalysis: Volume 25 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications

e-Beam Detection of Buried Open Defects in Semiconductor Device

The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education

Transmission Microscopy: Beginning Automation

High-Throughput Identification of Crystal Structures Via Machine Learning

The Power of AEM and Data Analytics: 20 Years of Teaching MSA at M&M

Ion Beam Induced Artifacts in Lead Based Chalcogenides

Analytical Electron Microscopy: Rivaling / Complementing Atom Probe Tomography

Teaching Microscopy Beats Analysis

Teaching Electron Microscopy; A Variety of Options for a Diverse Range of Students

MOOCS: A New Way of Teaching Transmission Electron Microscopy

TEM Characterization of a Refractory HEA Synthesized by High Energy Milling

Some Reflections on Collaborative Research in the Education of Young Scientists

Exploration of Novel Nano-scale Instabilities in Metastable Beta Titanium Alloys Using Transmission Electron Microscopy and Aberration-Corrected Scanning Transmission Electron Microscopy

Structure of TiN/CrN Interface in Nanolaminate Coatings with Enhanced Mechanical and Tribological Properties

Phase Formation and Microstructural Evaluation in V-Ti-Cr System Using Advanced Microscopy Analysis

Electron Microscopy Informed Catalyst Design

TMBA: DBW @70, STEM EELS SI @30, PANS TBD

The Role of Simulation of Valence Electron Energy Loss Spectroscopy (EELS) for Understanding Electronic Structure and Optical Properties of Materials

The Major Developments in Camera and Electron Energy Loss Spectrometer Technology Since the Turn of the Century

A STEM-based Path Towards Atomic-scale Silicon-based Devices

Toward More Brilliant Quantitative X-ray Analysis in (S)TEM

Microscopy and Microanalysis

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Volume 25 - June 2019

Physical Science Symposia

Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications

The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education