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The Power of AEM and Data Analytics: 20 Years of Teaching MSA at M&M

Published online by Cambridge University Press:  05 August 2019

Paul G. Kotula
Paul G. Kotula*
Affiliation:
Materials Characterization and Performance, Sandia National Laboratories, Albuquerque, NM, USA.
*
*Corresponding author: [email protected]

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2260 - 2261
Copyright
Copyright © Microscopy Society of America 2019 

References

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[2]Keenan, MR, Surf. Int. Anal. 41 (2009), p. 79.Google Scholar
[3]Brewer, LN, Kotula, PG and Michael, JR, Ultramicroscopy 108 (2008), p. 567.Google Scholar
[4]Wilkinson, AJ et al. , Ultramicroscopy 196 (2019), p. 88.Google Scholar
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[7]Kotula, PG and Keenan, MR (2006).Google Scholar
[8]Kotula, PG in “Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry”, ed. Carter, CB and Williams, DB, 2nd Ed. (Springer, NY), Ch. 2.Google Scholar
[9]Keenan, MR in “Techniques and Applications of Hyperspectral Image Analysis”, ed. Grahn, H and Geladi, P, (John Wiley & Sons, Chinchester).Google Scholar
[10]Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525.This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.Google Scholar