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Exploration of Novel Nano-scale Instabilities in Metastable Beta Titanium Alloys Using Transmission Electron Microscopy and Aberration-Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Yufeng Zheng ,
Rajarshi Banerjee  and
Hamish L. Fraser
Yufeng Zheng
Affiliation:
Center for the Accelerated Maturation of Materials and Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA.
Rajarshi Banerjee
Affiliation:
Department of Materials Science and Engineering, University of North Texas, Denton TX, USA
Hamish L. Fraser
Affiliation:
Center for the Accelerated Maturation of Materials and Department of Materials Science and Engineering, The Ohio State University, Columbus, OH, USA.

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2276 - 2277
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Fraser, HL et al. , in „Transmission Electron Microscopy for Physical Metallurgists Elsevier Science”, (Burlington).Google Scholar
[2]Zheng, Y et al. , Acta Materialia 103 (2016), p. 850.Google Scholar
[3]Zheng, Y et al. , Scripta Materialia 116 (2016), p. 49.Google Scholar
[4]Zheng, Y et al. , Scripta Materialia 113 (2016), p. 202.Google Scholar