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TEM Characterization of a Refractory HEA Synthesized by High Energy Milling

Published online by Cambridge University Press:  05 August 2019

JA Smeltzer ,
CJ Marvel ,
BC Hornbuckle ,
AJ Roberts ,
JM Marsico ,
AK Giri ,
KA Darling ,
JM Rickman ,
HM Chan  and
MP Harmer
JA Smeltzer
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, USA.
CJ Marvel
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, USA.
BC Hornbuckle
Affiliation:
Weapons and Materials Research Directorate, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD, USA.
AJ Roberts
Affiliation:
Weapons and Materials Research Directorate, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD, USA.
JM Marsico
Affiliation:
Weapons and Materials Research Directorate, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD, USA.
AK Giri
Affiliation:
Weapons and Materials Research Directorate, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD, USA.
KA Darling
Affiliation:
Weapons and Materials Research Directorate, U.S. Army Research Laboratory, Aberdeen Proving Ground, MD, USA.
JM Rickman
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, USA.
HM Chan
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, USA.
MP Harmer
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, USA.

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2272 - 2273
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Miracle, DB and Senkov, ON, Acta Mat. 122 (2017), p. 448.Google Scholar
[2]Senkov, ON et al. , J. Mater. Res. 33 (2018), p. 3092.Google Scholar
[3]Senkov, ON et al. , Intermetallics 19 (2011), p. 698Google Scholar
[4]Muramatsu, Y et al. , Materials Transactions 46 (2005), p. 681Google Scholar
[5]Veshchunov, MS, Materials (Basel) 2 (2009), p. 1252.Google Scholar
[6]Yang, X and Zhang, Y, Mater. Chem. Phys. 132 (2012), p. 233Google Scholar
[7]The support of ONR under grant # N00014-18-1-2181, monitored by D. Shifler, is gratefully acknowledged.Google Scholar