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Toward More Brilliant Quantitative X-ray Analysis in (S)TEM

Published online by Cambridge University Press:  05 August 2019

M. Watanabe
M. Watanabe*
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA, USA.

Abstract

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Type
The Success of TMBA: TEM and STEM Developments in Techniques, Applications and Education
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2292 - 2293
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Cliff, G. & Lorimer, G.W., J. Microsc. 103 (1975), p. 203.Google Scholar
[2]Watanabe, M., Horita, Z. and Nemoto, M., Ultramicrosc., 65 (1996), p. 187.Google Scholar
[3]Watanabe, M. and Williams, D.B., Z. Metallk., 94 (2003), p. 307.Google Scholar
[4]Watanabe, M. and Williams, D.B., J. Microsc., 221 (2006), p. 89.Google Scholar
[5]Fladischer, S. and Grogger, W., Ultramicrosc., 136 (2014), p. 26.Google Scholar
[6]Marvel, C. et al. , Ultramicrosc., (in review).Google Scholar
[7]Ritchie, N.W.M., DTSA-II, available through https://cstl.nist.gov/div837/837.02/epq/dtsa2/.Google Scholar
[8]The author wishes to acknowledge Dr. Dale Newbury for providing NIST glass samples.Google Scholar