Microscopy and Microanalysis: Volume 25 -

View selected items
Save to my bookmarks
Export citations
Download PDF (zip)
Save to Kindle
Save to Dropbox
Save to Google Drive
Save content to
To save this undefined to your undefined account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your undefined account. Find out more about saving content to .

To save this article to your Kindle, first ensure [email protected] is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Please be advised that item(s) you selected are not available.
You are about to save
Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
Your Kindle email address

Please provide your Kindle email.

@free.kindle.com @kindle.com (service fees apply)

By using this service, you agree that you will only keep content for personal use, and will not openly distribute them via Dropbox, Google Drive or other file sharing services

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Current Trends and Challenges in Electron Energy-Loss Spectroscopy

Towards Quantitative Nanomagnetism in Transmission Electron Microscope by the Use of Patterned Apertures

Decomposition of Core-Loss EEL Edges into a Linear Combination of Refined ‘Pure’ Spectra

Determination of Mn Valences in Li1−xMgxMn2O4 Using Monochromated EELS in an Aberration-Corrected STEM

Defect-Induced Electronic Structure Changes in Cesium Lead Halide Nanocrystals

Calculation of Chemical Shift for Ti via EELS White-Line-Ratio Method

Atomic Scale Near-Edge Structures of a Structurally Abrupt Ni-SrTiO3 Interface

Electronic Structure Characterization of the Bi-YIG by EELS-STEM

Activation of Co Fischer-Tropsch Catalyst: Exploring Co Valence State under Different Reduction Conditions Using STEM-EELS

Single Atom Identification of Barium by HAADF-STEM for the New Enriched Xenon Observatory (nEXO)

Observation of an Emerging Charged Domain Wall at a Non-ferroelectric Heterointerface with Aberration-corrected STEM

Background Modelling for Quantitative Analysis in Vibrational EELS

Measurement of the Point Spread Function for Low-Loss Inelastic Scattering

Plasmonic Metalattices: A Correlated Monochromated Electron Energy Loss Study and Theoretical Calculations

Benefits of a High Speed Low Point Spread Detector For Monochromated Electron Energy-Loss Spectroscopy

Microstructural Characterization of Boride Layers on Gray Cast Iron and Ductil Cast Iron by Dehydrated Paste-Pack Boriding

Microscopy and Microanalysis for Real-World Problem Solving

Sample Preparation Challenges in Advanced Semiconductor Test Structures

Improved sample preparation of beam-sensitive ultra-thin cuprate films

Combining Emerging Sample Preparation Methods, SEM, and TEM Investigations for Microelectronics Device Characterization at Multiple Scales

Industrial Applications of Electron Microscopy: A Shared Laboratory Perspective

Unique Challenges, Solutions and Methodologies for Planetary Sample Analyses

Microscopy and Microanalysis

Refine listing

Actions for selected content:

Save Search

Volume 25 - June 2019

Analytical and Instrumentation Science Symposia

Current Trends and Challenges in Electron Energy-Loss Spectroscopy

Microscopy and Microanalysis for Real-World Problem Solving