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Simultaneous Topographical and Electrochemical Mapping using Scanning Ion Conductance Microscopy – Scanning Electrochemical Microscopy (SICM-SECM)

Published online by Cambridge University Press:  05 August 2019

Gabriela Mendoza ,
Byong Kim  and
Keibock Lee
Gabriela Mendoza*
Affiliation:
Park Systems, Reforma Latino, Ciudad de Mexico, Mexico.
Byong Kim
Affiliation:
Park Systems, Inc., Olcott St., Santa Clara, CA, USA
Keibock Lee
Affiliation:
Park Systems, Inc., Olcott St., Santa Clara, CA, USA
*
*Corresponding author: [email protected]

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 696 - 697
Copyright
Copyright © Microscopy Society of America 2019 

References

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[3]Shi, W et al. , Faraday Discussions 193 (2016), p. 81.Google Scholar
[4]Shi, W and Baker, LA, RSC Adv. 5 (2015), p. 99284.Google Scholar