Routine Microscopy in Quantum Dot Industry

Xiao Feng Zhang

doi:10.1017/S1431927619004240

Routine Microscopy in Quantum Dot Industry

Published online by Cambridge University Press: 05 August 2019

Xiao Feng Zhang

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Xiao Feng Zhang*: Affiliation:
Nanosys Inc., 233 S. Hillview Drive, Milpitas, CA 95035
*: *Corresponding author: [email protected]

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Type: Microscopy and Microanalysis for Real-World Problem Solving
Information: Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 702 - 703

DOI: https://doi.org/10.1017/S1431927619004240 [Opens in a new window]

References

[1]https://www.nanosysinc.com/Google Scholar

Article contents

Routine Microscopy in Quantum Dot Industry

Abstract

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