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Aberration Correction for Analytical In Situ TEM – the NTEAM Concept.

Published online by Cambridge University Press:  01 August 2002

B. Kabius ,
C.W. Allen  and
D.J. Miller
B. Kabius
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
C.W. Allen
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439
D.J. Miller
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL 60439

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 418 - 419
Copyright
Copyright © Microscopy Society of America 2002