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A Simple Method For Determining Optimum Corrections For High-Accuracy Epma In Difficult Chemical Systems

Published online by Cambridge University Press:  01 August 2002

J. T. Armstrong ,
R. B. Marinenko  and
J. M. Davis
J. T. Armstrong
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371
R. B. Marinenko
Affiliation:
Undergraduate School of Engineering, Clemson University, Clemson, SC 29634-0911
J. M. Davis
Affiliation:
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899-8371 Undergraduate School of Engineering, Clemson University, Clemson, SC 29634-0911

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 438 - 439
Copyright
Copyright © Microscopy Society of America 2002