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Direct Mapping of Stacking Structure in Rotated Bilayer Graphene Using Aberration-corrected Transmission Electron Microscopy

Published online by Cambridge University Press:  09 October 2013

J.M. Yuk ,
H.Y. Jeong ,
N.Y. Kim ,
M.J. Lee ,
J.Y. Lee  and
Z. Lee
J.M. Yuk
Affiliation:
H.Y. Jeong
Affiliation:
N.Y. Kim
Affiliation:
M.J. Lee
Affiliation:
J.Y. Lee
Affiliation:
Z. Lee
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1226 - 1227
Copyright
Copyright © Microscopy Society of America 2013