Using Windowless EDS Analysis of 45-1000eV X-ray Lines to Extend the Boundaries of EDS Nanoanalysis in the SEM

S. Burgess; H. James; P. Statham; L. Xiaobing

doi:10.1017/S1431927613007708

Using Windowless EDS Analysis of 45-1000eV X-ray Lines to Extend the Boundaries of EDS Nanoanalysis in the SEM

Published online by Cambridge University Press: 09 October 2013

S. Burgess ,

H. James ,

P. Statham and

L. Xiaobing

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S. Burgess: Affiliation:
H. James: Affiliation:
P. Statham: Affiliation:
L. Xiaobing: Affiliation:

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Abstract

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1142 - 1143

DOI: https://doi.org/10.1017/S1431927613007708 [Opens in a new window]

Article contents

Using Windowless EDS Analysis of 45-1000eV X-ray Lines to Extend the Boundaries of EDS Nanoanalysis in the SEM

Abstract

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