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Getting Back to the Basics. Parameters that Must be Considered Before Attempting Quantitative EDS Analysis in the TEM

Published online by Cambridge University Press:  09 October 2013

N. Rowlands
Affiliation:
E.F. Schumacher
Affiliation:
A.W. Nicholls
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013