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Most cited

This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.

Contents

Page 563 of 602

  • Cited by 1

  • A Multiresolution Autofocusing Method for Automated Microscopy

  • Qiang Wu, Xiangyou Li, Tiehan Chen, Yuping Wang, Kenneth R. Castleman
  • Published online by Cambridge University Press:
    01 August 2003, pp. 1152-1153
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  • Cited by 1

  • Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis

  • John M. Hanchar
  • Published online by Cambridge University Press:
    04 August 2017, pp. 508-509
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  • Cited by 1

  • High Speed SPM for Novel Property Mapping of Functional Ceramics

  • V. Vyas, V. Palumbo, J. Bosse, Y. Kutes, L. Ye, B. D. Huey
  • Published online by Cambridge University Press:
    27 August 2014, pp. 1922-1923
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  • Cited by 1
  • Cited by 1

  • X-ray Mapping in the Spectrum Image Mode at Output Count Rates above 100 kHz with the Silicon Drift Detector (SDD)

  • D Newbury
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1380-1381
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

  • Cited by 1

  • First Direct Observation of Biological Molecules in Liquid by Environmental Phase Contrast Transmission Electron Microscopy

  • Y Inayoshi, H Minoda
  • Published online by Cambridge University Press:
    08 April 2017, pp. 530-531
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Cited by 1
  • Cited by 1

  • Quantitative TEM Tensile Testing on 1D Nano-structural Materials

  • ZW Shan, J Oh, A Minor, SAS Asif, OL Warren
  • Published online by Cambridge University Press:
    26 July 2009, pp. 1188-1189
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

  • Cited by 1

  • Cryostat Slice Irregularities May Introduce Bias in Tissue Thickness Estimation: Relevance for Cell Counting Methods

  • Anna Puigdellívol-Sánchez, Albert Giralt, Anna Casanovas, Jordi Alberch, Alberto Prats-Galino
  • Published online by Cambridge University Press:
    15 July 2015, pp. 893-901

  • Stereological techniques using the optical disectors require estimation of final section thickness, but frozen tissue irregularities may interfere with this estimation. Cryostat slices from rodent nerve tissues (dorsal root ganglia, spinal cord, and brain), cut at 16, 40, and 50 μm, were digitized with a confocal microscope and visualized through 3D software. Geometric section thickness of tissue (Tgeom) was defined as tissue volume/area. Maximal section thicknesses (Tmax), from the top to the bottom of the section, were measured in a random sample of vertical ZX planes. Irregularities were mostly related to blood vessels traversing the tissue and neuronal somas protruding over the cut surfaces, with other neuron profiles showing a fragmented appearance. Irregularities contributed to increasing the distance between the tops and bottoms of slices sectioned in different laboratories. Significant differences were found between Tmax and Tgeom for all thickness studies and counting frames (p<0.01). The Tgeom/Tmax average rate was 68.4–85.7% in volumes around cell profiles (∼600–1,200 μm2) and 83.3–91.8% in subcellular samples (∼25–160 μm2). Confocal microscopy may help to assess tissue irregularities, which might lead to an overestimation of tissue volume if section thickness is estimated by focusing on the top and bottom of the sections.

  • Cited by 1
  • Cited by 1
  • Cited by 1

  • Imaging the Alphavirus Exit Pathway

  • Maria Guadalupe Martinez, Erik-Lee Snapp, Geoffrey S. Perumal, Frank P. Macaluso, Margaret Kielian
  • Published online by Cambridge University Press:
    23 September 2015, pp. 409-410
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  • Cited by 1

  • Towards High Resolution in TEM and STEM: What are the Limitations and Achievements

  • Max Haider, Stephan Uhlemann, Peter Hartel, Heiko Müller
  • Published online by Cambridge University Press:
    27 August 2014, pp. 378-379
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  • Cited by 1

  • Refined Phase Imaging by Electron Diffractive Imaging

  • Jun Yamasaki, Yuki Shimaoka, Hirokazu Sasaki
  • Published online by Cambridge University Press:
    25 July 2016, pp. 1614-1615
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  • Cited by 1
  • Cited by 1

  • Scanning Electron Microscopy Characterization of Carbon Steel Fractured by Pressure while Exposed to Cryogenic Temperatures

  • MW Pendleton, C Mazzella
  • Published online by Cambridge University Press:
    01 August 2010, pp. 1260-1261
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

  • Cited by 1

  • Cryo FIB Applications: Metallographic Etching of Biological Materials; Cryolithography with Ice as an Environmentally Friendly Photoresist

  • WJ MoberlyChan, S Reyntjens, AM Minor
  • Published online by Cambridge University Press:
    31 July 2006, pp. 1268-1269
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

  • Cited by 1

  • Molecular Piracy via Capsid Size Determination by Staphylococcus aureus Pathogenicity Island 1

  • M Spilman, A Dearborn, J Chang, P Damle, G Christie, T Dokland
  • Published online by Cambridge University Press:
    08 April 2017, pp. 132-133
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  • Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

  • Cited by 1
  • Cited by 1

Page 563 of 602